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beam diameter (in in situ microanalysis)

Focused ion beam — Focused ion beam, also known as FIB, is a technique used particularly in the semiconductor and materials science fields for site specific analysis, deposition, and ablation of materials. The FIB is a scientific instrument that resembles a… … Wikipedia
Environmental scanning electron microscope — Wool fibers imaged in an ESEM by the use of two symmetrical plastic scintillating backscattered electron detectors … Wikipedia
ESEM — stands for environmental scanning electron microscope. This is a scanning electron microscope (SEM) that allows a gaseous environment in the specimen chamber. Whereas all conventional microscopes operate in vacuum, the ESEM has added a new… … Wikipedia
Transmission electron microscopy — A TEM image of the polio virus. The polio virus is 30 nm in size.[1] Transmission electron microscopy (TEM) is a microscopy technique whereby a beam of electrons is transmitted through an ultra thin specimen, interacting with the specimen as it… … Wikipedia